Details
KESHET-INSPECTOR is a powerful tool for spectral transmission measurements. The KESHET-INSPECTOR comprises dark field microscope and spectrometer (KESHET-PHOTON). The integrated system generates a darkfield image of a surface in addition to spectral transmission data. Darkfield microscopy is a useful technique to enhance inhomogeneity of a surface to locate defects since the output image excludes the unscattered light and enables observation of defects only. The spectroscopy signal designed to be collected from specific region of the surface while filtering the optical rays that are out of the specified region. When scanning a surface of a sample, spectral data can be analyzed for comparison and creating a data-cube (like in RGB image, location vs spectral transmission). Combining the darkfield microscopic image with spectroscopy analysis enables full observation, characterization of optical surfaces and assessment of defects/damage.
KESHET-INSPECTOR includes the microscope head. KESHET-PHOTON (compact fiber spectrometer) is sold separately and plugged into the KESHET-INSPECTOR. Both KESHET-INSPECTOR and KESHET-PHOTON are usually come together as a one integrated system. The client can choose the mounting technique in order to fit his setup. We offer a mechanical stage and optical breadboard as a full measurement setup.
Key features:
- The KESHET-INSPECTOR generates an optical dark field microscopic image (5 μm resolution) integrated with optical transmission spectroscopic signal. The data is generated by a CMOS image chip (microscope) and a linear CMOS (spectrometer).
- The spectral signal is taken from small specified region of the element surface. The transmission spectral measurement region is marked by the user interface and shown on the dark-field image, enables spectral comparison between different parts of the element and analysis of defects.
- The KESHET-INSPECTOR can be used for multiple applications including optical elements, such as electro-optics, biophotonics and lasing systems. It has several and critical advantages over other transmission spectroscopy techniques (like monochromator and simple transmission spectroscopy systems) where sampling location and precision are critical.
- KESHET-INSPECTOR package includes full viewer and SDK, combining image and spectral data.
- As an illumination source, the MICRO includes a QTH bulb for a wide spectral emission.
How to use?
The sample can be mounted on a XYZ translation stage (we offer XYZ-translation for fully working setup). First, bring the sample to focus (as in regular microscope) where the microscope shows a sharp image. Once the microscope shows a focused image, the system is ready to use. The collection region will be shown on screen, where spectroscopy signal will be plotted in parallel in additional window. Check the user interface page for additional info regarding the GUI.
