Spectral Transmission Microscope

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Spectral Transmission Microscope

KESHET-INSPECTOR offers a complete solution for analysis of flat optical elements (such as optical filters and chips), inspection in terms of spectral transmission/absorption and damage/defects characterization. A dark field microscope, integrated with an optical spectrometer, make KESHET-INSPECTOR a powerful tool for analysis of optical surfaces spectral transmission where defects and coating degradation are involved.

Light source QTH Lamp
Microscope FOV (W*H) 11.7 x 6.6 mm
Microscope MTF 55 lines/mm
Microscope dimensions (L*W*H) 165x57x173 mm
Full setup dimensions (including stage and breadboard) 285x115x173 mm
Stage travel X,Y axis: ±6.5 mm, Z axis: ±5 mm
Micrometer pitch 0.5 mm
Interface USB 2.0/3.0
Power supply 12V
GUI + SDK included
Description

Details

KESHET-INSPECTOR is a powerful tool for spectral transmission measurements. The KESHET-INSPECTOR comprises dark field microscope and spectrometer (KESHET-PHOTON). The integrated system generates a darkfield image of a surface in addition to spectral transmission data. Darkfield microscopy is a useful technique to enhance inhomogeneity of a surface to locate defects since the output image excludes the unscattered light and enables observation of defects only. The spectroscopy signal designed to be collected from specific region of the surface while filtering the optical rays that are out of the specified region. When scanning a surface of a sample, spectral data can be analyzed for comparison and creating a data-cube (like in RGB image, location vs spectral transmission). Combining the darkfield microscopic image with spectroscopy analysis enables full observation, characterization of optical surfaces and assessment of defects/damage.

 

KESHET-INSPECTOR includes the microscope head. KESHET-PHOTON (compact fiber spectrometer) is sold separately and plugged into the KESHET-INSPECTOR. Both KESHET-INSPECTOR and KESHET-PHOTON are usually come together as a one integrated system. The client can choose the mounting technique in order to fit his setup. We offer a mechanical stage and optical breadboard as a full measurement setup.

 

Key features:

  • The KESHET-INSPECTOR generates an optical dark field microscopic image (5 μm resolution) integrated with optical transmission spectroscopic signal. The data is generated by a CMOS image chip (microscope) and a linear CMOS (spectrometer).
  • The spectral signal is taken from small specified region of the element surface. The transmission spectral measurement region is marked by the user interface and shown on the dark-field image, enables spectral comparison between different parts of the element and analysis of defects.
  • The KESHET-INSPECTOR can be used for multiple applications including optical elements, such as electro-optics, biophotonics and lasing systems. It has several and critical advantages over other transmission spectroscopy techniques (like monochromator and simple transmission spectroscopy systems) where sampling location and precision are critical.
  • KESHET-INSPECTOR package includes full viewer and SDK, combining image and spectral data.
  • As an illumination source, the MICRO includes a QTH bulb for a wide spectral emission.

 

How to use?

The sample can be mounted on a XYZ translation stage (we offer XYZ-translation for fully working setup). First, bring the sample to focus (as in regular microscope) where the microscope shows a sharp image. Once the microscope shows a focused image, the system is ready to use. The collection region will be shown on screen, where spectroscopy signal will be plotted in parallel in additional window. Check the user interface page for additional info regarding the GUI.

Features

KESHET-INSPECTOR includes a simple and intuitive graphical user interface [GUI]. In addition to system, you will receive an installer file. Once you installed the program, you can open the app from your desktop shortcut.

 

KESHET-INSPECTOR GUI has two main windows:

  • Bright field microscopic image
  • DR spectroscopy signal

 

The GUI includes all functions required for driving the device:

  • Bright field image and spectral plot.
  • Microscope image markers show spectral region and metric scaling.
  • Record/play data: capture image/spectra. Record/play image/spectrum over time.
  • Export: Excel CSV file, jpeg and other image formats.
  • Reference mode: record your spectral reference and compare it to other objects.
  • Report generator: PDF report. GUI screenshot.
  • Check the KESHET-PHOTON’s GUI for additional information about Spectrometer’s GUI . 

 

Need to customize your report/analysis? Let us know what you need

Applications

What is dark field microscopy?

 

Dark field microscopy (dark ground microscopy) describes microscopy methods, in both light and electron microscopy, which exclude the unscattered beam from the image. As a result, the field around the specimen (i.e., where there is no specimen to scatter the beam) is generally dark. In optical microscopy, darkfield describes an illumination technique used to enhance the contrast in unstained samples. It works by illuminating the sample with light that will not be collected by the objective lens, and thus will not form part of the image. This produces the classic appearance of a dark, almost black, background with bright objects on it.

Name Spectroscopic signal analysis - FOV diameterOutput connectorMaximum object thickness Price Quantity

KESHET-INSPECTOR

12 mmFC/PC10 mm (with current stage)
US$0.00
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